Vision Potential SC-EPL Inspection Module: First PL+EL Integration for Minority & Series Resistance Defects

In solar cell and module manufacturing, the accuracy and comprehensiveness of defect inspection directly impact yield and power performance. Traditional PL cannot detect series resistance defects, while EL requires electrical contact and probing, leading to breakage risks. Vision Potential introduces the industry-first PL+EL dual-technology fusion EPL inspection device – the SC-EPL series, achieving full and precise identification of both minority-carrier and series-resistance defects.

EPL检测模组

Key Highlights: EPL Module · Inline EPL Inspection · Full-Process Coverage

The SC-EPL is a compact EPL module (400×350×600mm, ~20kg) that can be flexibly deployed in cell sorters, module production lines, or laboratories. Its breakthrough: performs EL-level electrical diagnostics without power or probing, while retaining PL sensitivity to intrinsic defects – eliminating blind spots of single-technology equipment.

Four Core Advantages

• Full-process defect control – Contact-free, probe-free, near-zero breakage rate; covers diffusion, passivation, printing, sintering, and more.

• In-house AI algorithm – Rapid defect standard setup; automatically identifies cracks, finger breaks, cold soldering, black spots, concentric rings, and 10+ defect types.

• High compatibility & multi-scenario – Compatible with PERC / TOPCon / HJT / xBC cells; bare cells, filmed cells, or encapsulated modules.

• Inline EPL inspection capability – Real-time production line integration; outputs high-SNR images within 0.5–2s cycle time; auto alarm/reject on anomalies.

Typical Applications

• Cell manufacturing – Online/offline sorting; multi-dimensional grading by minority carrier lifetime, defect distribution, and EL electrical performance.

• Module encapsulation – Pre/post-lamination analysis, string soldering defects, secondary lattice damage; dual EL+PL report.

• University/Lab – Process optimization, material intrinsic characterization, parameter iteration guidance.

Technical Highlights

• Camera: NIR-enhanced, 1MP, response 400–1200nm

• Light source: 808±5nm laser diode, uniformity ≥90%

• Detection accuracy: crack width >50μm; imaging resolution ≥0.2mm/pixel

• Control: Windows + proprietary AI software, one-click setup, RGB false-color imaging

Vision Potential's EPL inspection solution has been validated on production lines of major Chinese PV manufacturers, significantly reducing miss rates and false calls. Choosing inline EPL inspection means securing quality assurance from R&D to mass production.